30 September 2025 - 1 October 2025, Hall 7, MEETT, Toulouse, France

Q&A with Ramani Sankar Rajendran, Project Engineer, Carl Zeiss

01/08/2024

What will you be presenting at the Aerospace Test & Development Show?

At the Aerospace Test & Development Show, I will present a novel approach to using Digital Image Correlation (DIC) to enhance structural testing in aerospace. The Dynamic DIC involves moving the DIC system seamlessly to increase the measurement volume and thereby enabling the engineers to measure large components like aircrafts wings. This method leverages DIC’s robust stability and full field measurement capabilities to provide detailed, real-time data on material behaviour and structural integrity under various conditions. The rise of DIC in aerospace testing is driven by its ability to conduct non-contact, high-resolution measurements, crucial for detecting potential failures and study different failure modes.

DIC significantly reduces development lead times by streamlining the testing process with faster data acquisition and real-time analysis, allowing for quicker design iterations. Our involvement in the Smarter Testing project demonstrates our commitment to integrating advanced technologies like DIC into aerospace development, ensuring safer, more reliable products. This innovative use of DIC helps in driving forward aerospace testing and development.

What are the key challenges in the Aerospace Test & Development sector, and how will your presentation address them?

Some of the challenges in the Aerospace Test & Development are ensuring accurate and reliable testing, reducing development lead times, and maintaining cost efficiency. My presentation addresses these by showcasing Dynamic Digital Image Correlation (DIC) in large-scale structures test, which provides high precision and full-field measurements of aircraft wings. DIC is particularly effective to validate FEA models and when failure behaviour is unknown (usually the case with largescale component tests). It streamlines testing with faster data acquisition and real-time analysis, thereby reducing overall development time. Additionally, by enhancing test accuracy and efficiency, DIC minimizes costly reworks and optimizes resource use, contributing to cost-effective development.

Why is it important to participate in this event?

I think, participating in the Aerospace Test & Development Show is crucial for showcasing our innovative use of this technology, connecting with industry leaders, and staying updated with the latest advancements. This show provides a platform to demonstrate our work and involvement in different innovative projects that will help in optimising the aspects of aerospace testing. Engaging with peers and potential collaborators at this event will promote more knowledge exchange and eventually drives us to innovation.